Test instrument
source module isofit.test.test_instrument
Functions
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test_Sy_snr_diagonal — Sy for SNR model is diagonal with (meas/snr)^2 on the diagonal.
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test_Sy_snr_clamps_small_noise — Very small meas values are clamped so noise stays positive.
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test_sample_fastpath_same_wavelengths — When calibration is fixed and wavelengths match within wl_tol, rdn_hi is returned as-is.
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test_sample_fastpath_skipped_when_lengths_differ — When wl_hi has a different length, the fast path is bypassed and calibration() is called.
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test_calibration_no_statevec_returns_init — With no state vector elements, calibration returns wl_init and fwhm_init unchanged.
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test_calibration_wl_shift — WL_SHIFT element translates all wavelengths by the given offset.
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test_calibration_grow_fwhm — GROW_FWHM element broadens all channels by the given delta.
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test_eof_offset_single_eof_column — Offset equals eof_column * x_instrument[eof_idx].
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test_dn_additive_uncertainty_inflation — Doubling inflation doubles the output.
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test_dn_additive_uncertainty_zero_for_unity_ratio — When noise ratio is exactly 1.0, uncertainty is zero.
source test_xa_returns_copy_of_init()
source test_Sa_returns_cached_matrix()
source test_Sa_zero_state_returns_empty()
Sy for SNR model is diagonal with (meas/snr)^2 on the diagonal.
source test_Sy_snr_clamps_small_noise()
Very small meas values are clamped so noise stays positive.
source test_sample_fastpath_same_wavelengths()
When calibration is fixed and wavelengths match within wl_tol, rdn_hi is returned as-is.
source test_sample_fastpath_skipped_when_lengths_differ()
When wl_hi has a different length, the fast path is bypassed and calibration() is called.
source test_calibration_no_statevec_returns_init()
With no state vector elements, calibration returns wl_init and fwhm_init unchanged.
source test_calibration_wl_shift()
WL_SHIFT element translates all wavelengths by the given offset.
source test_calibration_grow_fwhm()
GROW_FWHM element broadens all channels by the given delta.
source test_eof_offset_no_eof_returns_zeros()
source test_eof_offset_single_eof_column()
Offset equals eof_column * x_instrument[eof_idx].
source test_dn_additive_uncertainty_inflation()
Doubling inflation doubles the output.
source test_dn_additive_uncertainty_zero_for_unity_ratio()
When noise ratio is exactly 1.0, uncertainty is zero.